Advanced machine learning is beginning to make inroads into yield enhancement methodology as fabs and equipment makers seek to identify defectivity patterns in wafer images with greater accuracy and ...
A novel remote inference capability places machine learning models at the assembly and test house, without any sensitive data leaving the assembly and test house. In semiconductor manufacturing, a low ...
In a new era of industrial revolution, intelligence is key. Knowing how product design can affect manufacturability or how production processes can affect finished quality helps manufacturers make ...
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