The complexity of electronic-device testing varies widely, ranging from the simplest type—manual testing—to the most complex—large-scale automatic test equipment (ATE). In between simple manual ...
During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...
Based on a new NPower open architecture and XTOS (eXtendable Test Operating System) software, the Sapphire NP automated test equipment (ATE) reduces cost by being ...
For more than six decades, artisans at Tobyhanna Army Depot (TYAD) have been at the forefront of repairing and employing automatic test equipment (ATE)to diagnose and test military equipment. That ...
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