A technical paper titled “Beyond the Last Layer: Deep Feature Loss Functions in Side-channel Analysis” was published by researchers at Nanyang Technological University, Radboud University, and Delft ...
A technical paper titled “SCAR: Power Side-Channel Analysis at RTL-Level” was published by researchers at University of Texas at Dallas, Technology Innovation Institute and University of Illinois ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback