Surface metrology has to increasingly deal with the presence of sub-micron thick films, which are now being used on products well beyond semiconductor devices. Sub-micron films may be incidental – for ...

Topography becomes more important in quality assurance for manufacturing. This regards the characterization of macro-sized to medium optics and the optimization of a manufacturing process using a ...

This experimental setup – based on coherence scanning interferometry – was developed at INRiM. Fiber sensing systems integrate photonic and optoelectronic components that are matched with fiber optics ...

Matter-wave interferometry can be used to probe the foundations of physics and to enable precise measurements of particle properties and fundamental constants. It relies on beam splitters that ...

Optical measurement techniques collecting light intensity in the far-field such as conventional and confocal microscopy or coherence scanning interferometry (CSI) enable fast and contactless ...

Accurately controlling film thickness and uniformity is extremely important for both throughput and performance in the automotive, aerospace, semiconductor, medical, and research industries. White ...

OCT, an interferometric imaging method, relies on wide-spectrum infrared light (usually from 0.8 µm to 1.4 µm) for optimal tissue penetration. Traditionally used in ophthalmology, OCT has now expanded ...

Optical Profilometry employs light to measure surface contours and roughness by analyzing the interaction between light waves and the surface under examination. It utilizes various principles such as ...