The first SWIR line scan camera from Teledyne DALSA offers up to 74 dB dynamic range and spectral response from 950 to 1700 nm With exceptional responsivity and low noise, this newest Linea SWIR line ...
Business competition pressures manufacturers to produce faster, reduce expenses, and increase efficiencies. But all these requirements run into the quality control issue sooner or later — with the ...
Teledyne DALSA introduces its Linea ML 8k multispectral CLHS line scan camera for improved defect detectability with a single scan. Teledyne DALSA, a Teledyne Technologies [NYSE:TDY] company, is ...
The founding team of CEO Sophia Millar, Chief Technical Officer George Hallo, and Chief Product Officer Hooman Piroux ...
As the final step in the production process, inspection is of critical importance to the manufacturing industry. Manufacturers generally allot adequate staff resources to perform inspection for the ...
MILPITAS, Calif., July 8, 2019 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the 392x and 295x optical defect inspection systems and the eDR7380™ e-beam defect review system. The new ...
WEINHEIM, Germany—Quality, it turns out, is about perspective. The right perspectives highlight your strengths and illuminate areas for improvement. And when it comes to your products, seeing them ...
Wafers can be inspected for large, obvious defects, or for small, subtle ones. The former is referred to as macro-inspection, while the latter is micro-inspection. These processes use different ...
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