Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
(Nanowerk News) An international team of researchers, led by Professor Yu Zou (MSE), is using electric fields to control the motion of material defects. This work has important implications for ...
An international team of researchers, led by University of Toronto Engineering Professor Yu Zou, is using electric fields to control the motion of material defects. This work has important ...
SIAM Journal on Applied Mathematics, Vol. 60, No. 2 (Dec., 1999 - Feb., 2000), pp. 664-678 (15 pages) In this paper we analyze hypersingular integral equations of the Peierls type specified on the ...
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