The VALID SL in-circuit and functional test system is designed for high-channel-count testing in demanding electronics manufacturing environments. Introduces a cable-free architecture with new ...

SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...

Part I of this series introduced the lead/lag control strategy as it applies to parallel pump operation and discussed the need for identifying the designer’s intent for a particular system. Part II ...