Semiconductor Engineering

Improve Logic Test With A Hybrid ATPG/BIST Solution

Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
Electronic Design

What’s The Difference Between ATPG And Logic BIST?

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...
Embedded

HARDWARE TOOLS – Tektronix introduces logic protocol analyzer test solution for PCI Express 3.0

Beaverton, Ore. – The new Tektronix TLA7SA16 and TLA7SA08 Logic Protocol Analyzer modules, bus support software, and probes combine to give PCIe 3.0 developers an exclusive time-correlated view of ...
Electronic Design

10 Boundary Scan Tips Optimize Test Coverage

To ensure customers receive high-quality products, engineers must consider testing strategies before they even think about a schematic diagram. These days, most engineers realize boundary scan ...