Equipment To measure and calibrate monitors, we use an X-Rite i1 Pro spectrophotometer, i1 Display Pro colorimeter, and the latest version of Portrait Displays Calman software. We get our test ...

Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...

Chip testing has become increasingly complex due to the number of variables impacting designs – from design size and complexity, to high transistor counts on advanced technology nodes, to 2.5D/3D ...