Portable 3D optical inspection with 4Di InSpec transforms surface metrology, enhancing defect detection and quality assurance ...

Measuring super smooth surfaces generally necessitates the use of optical metrology tools, but it is important to note that optical solutions are not all the same. The choice of metrology solution for ...

Patterning challenges for the semiconductor industry are growing as the number of multi-patterned layers being used in the 10nm and beyond nodes increase. Patterning requires highly accurate overlay ...

University of Illinois Physics Professor Paul Kwiat and members of his research group have developed a new tool for precision measurement at the nanometer scale in scenarios where background noise and ...

There are significantly different architectures for what are known as “atomic” clocks. Optically driven atomic clocks offer a new set of performance attributes. The optical atomic clocks use paired ...