STAr Technologies, a leading supplier of semiconductor reliability test systems, announced the shipment of the all-in-one SMU-per-pin test system, the STAr Pluto-hiVIP, to benchmark the semiconductor ...

Although multi-die designs — an increasingly popular approach for integrating heterogeneous and homogenous dies into a single package — help resolve problems related to chip manufacturing and yield, ...

Collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs HAIFA, ...

STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...

http://www.maxwell.comSystem reliability concerns are imperative to the implementation of today's broadband wireless infrastructure. Wireless networks require new ...