It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...
While many techniques have evolved to address power minimization during the functional mode of operation, it is also necessary to manage power during the test mode. Circuit activity is substantially ...
New Release Provides Support for Verilog2001 and a Wide Range of Usability Improvements across the Built-In Self-Test Product Line SAN JOSE, Calif. -- Aug. 21, 2007 -- LogicVision, Inc., a leading ...
As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...
The proliferation of semiconductor devices into safety-critical applications such as automotive and medical opens a new can of worms for test and reliability. An ever widening range of devices must ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
WILSONVILLE, USA: Mentor Graphics Corp. announced that STMicroelectronics has adopted the TestKompress automatic test pattern generation (ATPG) product into its standard 65nm and 45nm design kits. The ...
The amount of electronic content in passenger cars is growing rapidly, primarily due to the integration of advanced safety features. The shift towards fully autonomous vehicles, which must comply with ...
It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...
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