Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

For over 15 years, I've been a big proponent of hierarchical test. Hierarchical test is the commonly used term for creating DFT (design-for-test) features and test patterns at lower level circuit ...

Once unzipped, each pattern is around 24MB. If you're already a member her is a direct link to the 4K ISF Test patterns. The Imaging Science Foundation (ISF) has released some free 4K test patterns ...

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The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

In November 1953, The New York Times reported that late-night television audiences across New York had “discovered a new quiz game” on WNBT, the local NBC affiliate. It did not air on a regular basis ...