LIVERMORE, Calif. — FormFactor Inc. here today (Feb. 15) announced a major advancement in probe-card technology that enables IC manufacturers to test up to 128 chips on a wafer with a single ...
STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
Santa Rosa, CA. Keysight Technologies has introduced two extreme-temperature probing solutions: the N7007A extreme-temperature 400-MHz passive probe and the N7013A extreme-temperature extension kit ...
STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...
The µHELIX® line of durable, fine-pitch probes is designed to test electrical targets with ±15-micron pointing accuracy on 10-mil center-to-center placement. Probe diameter sizes are 20, 16, 12, and 8 ...
In an extreme heat environment, such as during the sintering of powdered metals, in solid waste incinerators, or in oil or gas fired-furnaces, thermocouple probes need to be able to withstand extreme ...
To test the durability of the probe cables at high temperatures, we used our finalists in a screaming-hot, 650 °F to 700 °F grill. After our initial round of testing, we used the remaining contenders ...
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