Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

In this digital world, it may be hard for some to believe that there’s still a place for anything manual or physical—especially in the engineering realm. And, while it’s true that today’s technologies ...

Designers of robot control systems are being pushed to provide better performance and more features, all while meeting tight deadlines and keeping costs down. As these demands grow, traditional design ...

Embedded and computing systems have become increasingly more powerful by incorporating high-speed buses, industry standard subsystems, and more high-integrated-functionality chips. They have also ...

What are the challenges of incorporating testing and chiplets? What is a typical test configuration for testing chiplets? 1. Keysight’s M800 series bit-error-ratio testers (BERTs) support NRZ and PAM4 ...

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

LIEBEFELD, Switzerland, Dec. 7, 2022 /CNW/ -- The new generation Performance real-time target machine (P3) is a scalable, high-performance test system for hardware-in-the-loop (HIL) simulation of ...

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...