EDN

Optimizing functional-test throughput in PXI-based automated test systems

To ensure ongoing competitiveness, most manufacturing engineers are looking for new and better ways to optimize test throughput while ensuring measurement integrity. Manufacturing targets can be very ...
Semiconductor Engineering

High-Throughput Image Sensors: Smart Testing Powers Progress

As data streams grow, modern ATE ensures flexible, scalable accuracy.
Electronic Design

Jitter Testing – A High-Throughput Jitter Analysis Test Strategy

A promising solution for economical precision test can take your jitters out of jitter testing. Multigigabit high-speed serial (HSS) interfaces like PCI Express, Fibre Chan-nel, XAUI, and Serial ATA ...
Business Wire

Keysight Introduces Massively Parallel Board Test System to Enable Higher Throughput in a Smaller Footprint

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that helps enterprises, service providers and governments accelerate innovation to connect ...
Nasdaq

Keysight’s New Parallel Parametric Test System Delivers High Throughput and Cost-Effective Wafer Test

SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
EDN

Advantest doubles dynamic test handler throughput

Tokyo—Advantest Corp. has announced its M6242 dynamic test handler that provides throughput of 42,200 units per hour for high-volume production test of memory devices such as DRAM. The M6242 supports ...