As IC geometries shrink, the large, consolidated memory blocks within ICs are giving way to tens or even hundreds of smaller memory arrays distributed throughout each chip. These arrays serve as ...
Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
Irix is inviting all photo enthusiasts to take part in a competition and become Irix 150mm lens testers. Entries close at the end of the 22nd November. Irix Press Release Enter our Irix Photo testers ...
MOSAID Technologies Incorporated announced the availability of its BIST (built in self-test) controller for embedded memory applications. The BIST controller has already been licensed to a lead ...
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